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Spectroscopy on Mars: A Look at What’s Been Uncovered About the Red Planet
Spectroscopy has played a significant role in the Mars expeditions, including the confirmation of the former presence of water on the Red Planet. Raymond Arvidson, the James S. McDonnell, a Distinguished University Professor at Washington University in Saint Louis, Missouri, is involved with the various National Aeronautics and Space Administration (NASA) missions to Mars and the spectroscopy incorporated in the instruments sent there. Here, Arvidson discusses those techniques, including a hyperspectral imaging system, an emission spectrometer, and an X-ray spectrometer, and what the results of the missions indicate about Mars so far. Arvidson is the winner of the 2016 Lester W. Strock award presented by FACSS. This interview is part of the series with the winners of awards to be presented at the SciX 2016 conference. |
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Ensuring Product Quality with Process Raman and FT-IR Spectroscopy
John Wasylyk, a principal scientist at Bristol-Myers Squibb in New York, New York, has been using quality by design (QbD), Raman spectroscopy, and Fourier transform infrared (FT-IR) spectroscopy in process development as well as for at-line and on-line monitoring of active pharmaceutical ingredient (API) crystallization. Here, he discusses the advantages, limitations, and challenges of these techniques. |
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How to Select the Appropriate Degrees of Freedom for Multivariate Calibration
There is some confusion about the use of degrees of freedom (df) for various calibration and prediction situations. The problem lies in computing a standard deviation using different df values without a more rigorous explanation and then placing emphasis on the actual number derived for the standard error, rather than on the computed confidence intervals. |
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| The Perfect Package for Reflectance Spectroscopy |
Optimized Spectroscopic Raman Systems |
Transportable Mass Spectrometer –Portability™ |
We've packaged the new Flame spectrometer with selected accessories, light sources and software for reflectance. You get the convenience of application-ready setups at pricing that saves you a bundle!  Learn more |
WITec's spectroscopic Raman systems operate with ultra-high throughput spectrometers for high-speed and high-resolution imaging. Several focal lengths and multiple excitation wavelengths (UV to IR) provide optimized systems for individual requirements.  Learn more |
BaySpec Portability™ is designed with light weight and battery operation for field applications. Featuring miniaturized linear ion trap technology and dual sampling inlets, Portability™ achieves ppb-level detection allowing directly atmospheric sampling for gas, liquid and solid samples.  Learn more |
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| Moxtek ICE Cube Beamsplitter |
Rigaku NEX DE VS |
Instant Handheld Raman Analyzer |
Moxtek's ICE Cube™ is optimized for use over a wide range of acceptance angles while maintaining color uniformity and image contrast in the visible wavelength ranges.
 Learn more |
NEX DE VS is the newest Rigaku direct excitation EDXRF elemental analyzer. NEX DE VS analyzer is suited for small spot analysis applications. It features a high-resolution camera combined with automated collimators.  Learn more |
Integrating seamlessly at all phases of the manufacturing process, Metrohm’s Raman analyzer (Mira) provides rapid measurements for identification, screening and confirmation. From raw materials to final product quality control, Mira brings the analysis to the sample.  Learn more |
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| Czitek Introduces The SurveyIR™ |
Charge Carrier Recombination Dynamics Revealed |
PHOENIX II Benchtop Analyzer |
SurveyIR™ is a new spectrometer sample compartment mounted FT-IR microanalysis accessory. SurveyIR integrates digital video microscopy with IR microspectroscopy in a user-installed package. SurveyIR features transmission, reflection, and diamond-ATR spectrometry. 
Learn more |
Edinburgh Instruments have recently collaborated with the Universities of Trento and Mumbai to work on the recombination dynamics of copper-nitrogen doped titanium oxide for use in water splitting applications.
 Learn more |
Polarized ED-XRF is ideal for elemental analysis of liquids, solids, pastes, slurries and powders for measuring Al through U qualitatively and quantitatively. Unit is compact, low cost, simple to operate.  Learn more |
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New Webcasts
Implementation of USP 232 and ICH Q3D: What is Required and How to Do It
Tuesday, June 28, 2016, 8 am PDT | 11 am EDT | 4 pm BST | 5 pm CEST
Learn More >>
High Preciscion Elemental Analysis Using an ED-XRF Spectrometer
Thursday, June 30, 2016, 8 am PDT | 11 am EDT | 4 pm BST | 5 pm CEST
Learn More >>
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