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Total Reflection X-ray Fluorescence Spectrometry for Metals and Nanoparticle Analysis
Total reflection x-ray fluorescence (TXRF) spectrometry is an energy-dispersive x-ray technique that is used for elemental and chemical analysis, and is especially suitable for small-sample analyses. Ursula Fittschen, an assistant professor at Washington State University, has been using TXRF to analyze stainless steel metal release, and also airborne silver nanoparticles (NPs) from fabrics. Here, she describes the advantages and challenges of this technique. |
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The Milestone DMA-80: Innovation Delivered. |
REVOLUTIONIZE THE CHARACTERIZATION OF BIOMOLECULES |
The Milestone DMA-80 can be scaled to handle any matrix-solids, liquids and gases. Offering push-button operation no sample prep and internal temperature monitoring for new levels of safety and convenience. Learn more |
The J-1000 Series CD Spectrometers offers unparalleled sensitivity, with reach from the vacuum UV to the NIR wavelengths. JASCO also showcases the Simultaneous Multi-Probe Spectroscopy (SMP) which consists of three modes (CD, LD and Absorbance). Learn more |
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Low-frequency/THz-Raman® In-situ Probe |
PHOENIX II Benchtop Analyzer |
Ondax's new patented THz-Raman® Probe simultaneously captures low-frequency and chemical fingerprint signals, delivering both chemical composition and molecular structural analysis in a single measurement for any process or lab environment. Learn more |
Polarized ED-XRF is ideal for elemental analysis of liquids, solids, pastes, slurries and powders for measuring Al through U qualitatively and quantitatively. Unit is compact, low cost, simple to operate. Learn more |
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New Webcasts
Raman Spectroscopy and Imaging of Low-Energy Phonons in Solid-State Structures
Thursday, June 16, 2016
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Investigating CO2 Where and When You Want It: High Precision Carbon and Oxygen Isotope Analysis
Monday, June 20, 2016
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Live Webcast Series
Part 1: Which Technique is Right for My Trace Elemental Analysis?
Tuesday, June 21, 2016
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Part 2: What is Required and How to Do It
Tuesday, June 28, 2016
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High Precision Elemental Analysis Using an ED-XRF Spectrometer
Thursday, June 30, 2016
Learn More >>
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