|
|
 |
Analysis of Milk Powders Based on Chinese Standard Method Using the Agilent 5100 SVDV ICP-OES
Neli Drvodelics, Agilent Technologies
This Agilent 5100 SVDV ICP-OES with DSC technology allows measurement of both axial and radial readings in a single, fast, cost effective measurement. Trace toxic and major nutrient elements were measured in a single measurement in a milk powder SRM, with no ionization buffers. Excellent recoveries were achieved for all elements determined in the SRM using SVDV mode demonstrating the accuracy of the method of a large dynamic range. This work shows that the Agilent 5100 SVDV ICP-OES is suited to Chinese method GB 5413.21 for the analysis of milk powders.
Read More |
|
| |
|
 |
Synchronous Vertical Dual View (SVDV) for Superior Speed and Performance
Agilent Technologies
The Agilent 5100 ICP-OES revolutionizes ICP-OES analysis. It is designed to run your samples faster, using less gas, without compromising performance on your toughest samples. The 5100 SVDV features unique dichroic spectral combiner (DSC) technology that selects and combines axial and radial light from a robust vertical plasma, in a single measurement covering the entire wavelength range. This capability, together with the high speed VistaChip IIC CD detector and the innovative SVS 2+ switching valve, provides the fastest sample throughput and the lowest gas consumption per sample of any ICP-OES.
Read More |
|
Benefits of a Vertically Oriented Torch – Fast, Accurate Results, Even for Your Toughest Samples
Agilent Technologies
Learn about the benefits of a vertically oriented torch — fast, accurate results, even for your toughest samples. Agilent’s 5100 ICP-OES with a vertical torch provides the ultimate configuration for determining tough samples while achieving detection limits expected from an axially viewed plasma. The SSRF system delivers reliable, robust, and maintenance-free plasma for even the toughest samples and achieves unmatched long-term stability. The plug-and-play torch with MFC control of all plasma eliminates the torch alignment process that is often required when analyzing challenging samples, and ensures consistent and reproducible results
Read More |
|
CCD and CID Solid-State Detectors
Agilent Technologies
A technical discussion about the benefits of Agilent’s VistaChip II CCD detector in comparison to charge-couples device (CCD) detectors used by other ICP-OES systems.
Read More |
|
Superior ICP-OES Optical Design for Unmatched Speed and Performance
Agilent Technologies
The Agilent 5100 ICP-OES combines a vertical torch, unique dual view and synchronous dual view pre-optics, and state-of-the-art Echelle optical design with innovative CCD detector technology. This combination provides unique, true simultaneous measurement, full wavelength coverage, and enables unrivalled elemental analysis speed and performance.
Read More |
|
|
|
Real-Time Spectral Correction of Complex Samples Using FACT Spectral Deconvolution Software
Agilent Technologies
Agilent’s Fast Automated Curve-fitting Technique (FACT) provides real-time spectral correction by using an advanced spectral modeling technique to mathematically separate the analyte signal from the raw spectrum. A simpler and more powerful alternative to inter-element correction, FACT provides accurate background correction, enabling you to analyze spectrally complex samples with confidence.
Read More |
|
|
|
