Spectroscopy App Note:
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July 2013  
 
Determination of Mercury in Samples with Extremely High Mercury Concentration
David Gunn, Milestone
Milestone Inc., introduces the DMA-80 Wide Range (WR) direct mercury analyzer for the widest range of detection in the market — from 0.003 to 30,000 ng and concentrations in the hundreds of ppm to handle samples with extremely high levels of mercury.
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WDXRF App Note: Ultra-Low Sulfur in Automotive Fuels
Laura Oelofse, Rigaku Corporation
Application note #5053 describes measurement of sulfur, in both diesel and gasoline, with a Rigaku Micro-Z ULS analyzer. Lower limit of detection (LLD) was determined to be 0.3 ppm sulfur.
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Measurement of Elemental Impurities in Pharmaceutical Products
Shimadzu
Widely used as trace metal analytical methods, ICP-AES and ETAAS are effective for analysis of metallic impurities in pharmaceutical products and their raw materials. This application presents such an analysis, with the commonly used anti-inflammatory analgesic acetylsalicylic acid (aspirin) as the sample.
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Speciation of Zinc in Microliter Volumes of Plant Sap by Capillary HPLC-ICP-MS
Paulina Flis, Laurent Ouerdane, and Ryszard Lobinski, Agilent Technologies
Describes an ICP-MS-assisted metallomic approach to the separation of zinc species present in post-phloem of Pisum sativum. The embryo sac liquid was analyzed by capillary HPLC-ICP-MS with on-line preconcentration. The use of capillary chromatography was essential due to the low amount of plant sap available. Two zinc species were successfully identified: zinc-nicotianamine (NA) and zinc-(histidine)2 complexes, proving that NA and histidine are two major ligands that complex zinc in post-phloem of green pea.
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FT-NIR —  Fast and Effective for Controlling Critical QC Parameters in the Sugar Industry
Hui Li, Bruker Optics, Inc.
Bruker’s FT-NIR system was used in this study to monitor critical QC parameters in all steps of processing sugar cane.
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Gaining Deeper Insights into Thin Film Response — Overcoming Spectral Oscillations Using the Cary Universal Measurement Accessory
Robert Francis and Travis Burt, Agilent Technologies
This application note demonstrates how an Agilent Cary 5000 UV-Vis-NIR spectrophotometer equipped with a new Universal Measurement Accessory (UMA) is able to provide previously unreported insights into thin film characterization due to its ability to measure %T and %R without moving the sample.
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